Atomic Force Microscopy (AFM) for Polymer Characterization and Analysis

   
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Atomic Force Microscopy (AFM) for Polymer Characterization and Analysis
Загружено 14 февраля 2017
(AFM) is uniquely suited to characterize polymer materials on the nanoscale revealing structures and ...

AFM - Atomic Force Microscopy Animation
Загружено 23 сентября 2014
Atomic force microscopy (AFM) is used to study materials by scanning over the surface with a very sharp tip. Read more: ...

AFM basic tutorial
Загружено 19 февраля 2013
This is a basic tutorial for using our Innova Scanning Probe AFM in Dr. Burgers Group at Fisk University. This video covers basic operation, including how to load ...

Mod-01 Lec-24 Atomic Force Microscope - III
Загружено 20 февраля 2013
Instability and Patterning of Thin Polymer Films by Dr. R. Mukherjee, Department of Chemical Engineering, IIT Kharagpur. For more details on NPTEL visit ...

nanoHUB-U Fundamentals of AFM L4.2: Force Spectroscopy - The Approach Curve
Загружено 2 июня 2014
Table of Contents: 00:09 Lecture 4.2: The Approach Curve 00:51 The AFM co-ordinate system 01:59 Measuring Force vs. z-displacement 08:22 Jump to Contact ...

What is POLYMER CHARACTERIZATION? What does POLYMER CHARACTERIZATION mean?
Загружено 23 апреля 2017
What is POLYMER CHARACTERIZATION? What does POLYMER CHARACTERIZATION mean? POLYMER CHARACTERIZATION meaning - POLYMER ...

Mod-01 Lec-22 Atomic Force Microscope - I
Загружено 20 февраля 2013
Instability and Patterning of Thin Polymer Films by Dr. R. Mukherjee, Department of Chemical Engineering, IIT Kharagpur. For more details on NPTEL visit ...

Characterizing Multicomponent Polymer with PinPoint™ AFM
Загружено 16 сентября 2015
Park Systems' PinPoint mode is a new and unique AFM imaging solution which is useful to analyze the mechanical characteristics of multi-component polymer.

AFM data analysis
Загружено 29 марта 2016
CHE 422 Inorganic Chemistry Gold Nanoparticles measuring particle size by atomic force microscopy.

AFM prep
Загружено 22 февраля 2016
CHE 422 preparing the sample for the atomic force microscope.

AFM Tapping
Загружено 15 января 2016
This animation is about tapping mode. It shows the cantilever that oscillates at high frequency and the two boxes influence on the scan. The rendering is done ...

How AFM Works 2-3 Tapping Mode
Загружено 1 июля 2015
In this alternative technique to non-contact mode, the cantilever again oscillates just above the surface, but at a much higher amplitude of oscillation. The bigger ...

Sample mounting
Загружено 19 октября 2011
Scanning probe microscope (or atomic force microscope) sample mounting.

Webinar - "Beyond Topography: New Advances in AFM Characterization of Polymers"
Загружено 25 августа 2015
Presented on May 28, 2015 by Dr. Donna Hurley, Lark Scientific and Dr. Anna Kepas-Suwara, Tun Abdul Razak Research Centre (TARRC) Whether ...

Multimode AFM training
Загружено 13 января 2017
Burker Multimode 8 training video, instrument within the goldwater materials research facility of the LeRoy Eyring center for solid state science at Arizona State ...

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