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Atomic Force Microscopy (AFM) for Polymer Characterization and Analysis

   
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Atomic Force Microscopy (AFM) for Polymer Characterization and Analysis
Загружено 14 февраля 2017
(AFM) is uniquely suited to characterize polymer materials on the nanoscale revealing structures and ...

AFM - Atomic Force Microscopy Animation
Загружено 23 сентября 2014
Atomic force microscopy (AFM) is used to study materials by scanning over the surface with a very sharp tip. Read more: ...

Mod-01 Lec-22 Atomic Force Microscope - I
Загружено 20 февраля 2013
Instability and Patterning of Thin Polymer Films by Dr. R. Mukherjee, Department of Chemical Engineering, IIT Kharagpur. For more details on NPTEL visit ...

Characterizing Multicomponent Polymer with PinPoint™ AFM
Загружено 16 сентября 2015
Park Systems' PinPoint mode is a new and unique AFM imaging solution which is useful to analyze the mechanical characteristics of multi-component polymer.

AFM basic tutorial
Загружено 19 февраля 2013
This is a basic tutorial for using our Innova Scanning Probe AFM in Dr. Burgers Group at Fisk University. This video covers basic operation, including how to load ...

AFM prep
Загружено 22 февраля 2016
CHE 422 preparing the sample for the atomic force microscope.

spincasting AFM sample
Загружено 7 марта 2016
CHE 422 ROMP lab. How to prepare a polymer film for atomic force microscopy using a homemade spin casting equipment.

Sample Preparation for Atomic Force Microscopes: Recorded Seminar
Загружено 16 марта 2016
Succesful atomic force microscopy imaging requires proper sample preparation. Techniques for accurate sample preparation in life sciences, material sciences, ...

AFM data analysis
Загружено 29 марта 2016
CHE 422 Inorganic Chemistry Gold Nanoparticles measuring particle size by atomic force microscopy.

More Than Just Roughness AFM Techniques for Thin Film Analysis
Загружено 30 августа 2017
KNI NanoTech 2017: More Than Just Roughness AFM Techniques for Thin Film Analysis - Mayur Savla, Asylum Research Oxford Instruments, Inc.

Webinar - "Beyond Topography: New Advances in AFM Characterization of Polymers"
Загружено 25 августа 2015
Presented on May 28, 2015 by Dr. Donna Hurley, Lark Scientific and Dr. Anna Kepas-Suwara, Tun Abdul Razak Research Centre (TARRC) Whether ...

Sample Plate Assembly, Mounting and Placement on the Atomic Force Microscope
Загружено 27 июля 2015
Sample plate assembly, mounting and placement on the Keysight Atomic Force Microscope. Also detailed explanation of how to mount a cantilever on the nose ...

AFM/Atomic Force Microscopy
Загружено 4 февраля 2018
AFM/Atomic Force Microscopy principle,history and uses of AFM. It's a very high-resolution type of scanning probe microscope that can work more than 1000 ...

ERDC Determination of Nanomechanical Properties by Atomic Force Microscopy
Загружено 20 февраля 2015
The following methods developed at ERDC provide a guide to measure mechanical properties of materials by means of an atomic force microscope (AFM).

AFM Principle- Basic Training
Загружено 4 марта 2014
AFM Principle- Basic Training.

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